With embedded instruments, certain test structures are integrated on a chip. For example, those of a logic analyzer, a digital multimeter or even an oscilloscope. With these embedded functions, certain parameters can be monitored during operation and an alarm can be triggered in case of deviation from predefined target values.
The IEEE is dealing with this topic in the IEEE 1687 working group and has worked out a corresponding standard. The concept provides that the measured values can also be fed to external components for evaluation.