interconnect built in self test (IBIST)

In traditional test and measurement techniques, certain signal limit values are measured at one or a few circuit points, since the load on the circuit points caused by the test probes falsifies the measurement results. In addition, the measurements are performed with a time lag.

The situation is different with embedded measurement technology, where measurements can be taken simultaneously at several points or on all paths of a bus without falsifying the measurement results.

Interconnect Built in Self Test (IBIST) is such an embedded test technique with which all paths of all buses can be measured simultaneously. The IBIST technique is considered and implemented during chip development. Depending on the implementation, error rate tests( BER) can be performed, eye diagrams can be displayed or random pattern test can be executed.