transient buffer exposure (ATM) (TBE)

The Transient Buffer Exposure (TBE) is an ABR service parameter ofATM.

The TBE parameter is about the negotiated number of RM cells during the start-up phase. It is about the time before the first RM cell came back. The Transient Buffer Exposure determines the load on the switches during sudden traffic changes and influences the Cell Rate Margin( CRM) and the Initial Cell Rate( ICR).