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joint test action group (JTAG)

The Joint Test Action Group (JTAG), founded in 1985, is concerned with the development of software-controlled, automated test procedures of ASICs(Application Specific Integrated Circuit) or printed circuit boards. The test procedure developed by JTAG was standardized by IEEE in 1990 as IEEE 1149.1 and is known as boundary-scan test. For programming, emulation and debugging ofcontrollers, the JTAG has specified the JTAG connector, which can be used as an interface converter.

Englisch: joint test action group - JTAG
Updated at: 17.03.2011
#Words: 67
Links: software (SW), test, procedure, institute of electrical and electronics engineers (IEEE), IEEE 1149
Translations: DE

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