The Boundary Scan Description Language (BSDL) is a description language used to document the scan resources available in a particular integrated circuit. The information
is made available to software tools for automated processing. All boundary-scan tools can read and parse the BSDL files and derive from them which test modes are supported by the respective chip and which boundary-scan cell must be used, for example, to switch a specific pin. In practical test operation, test tools use BSDL files together with CAD data for automated test generation.