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automated test pattern generation (test system) (ATPG)

Automatic Test Pattern Generation (ATPG) is used to generate bit patterns with which chips, logics and functional units are subjected to a functional test during production. Depending on the circuit technology, the test patterns must be designed for digital logics or analog circuits.

In the case of digital circuits, bit pattern generation aims to produce as many bit patterns as possible in order to simulate errors in the circuits or in the components. Since the complexity of memory and central processing units is extremely high, it is completely impossible in terms of test time and test program generation to test each function individually and thus determine every possible error. The test patterns are therefore developed in such a way that test time requires a minimum of time and at the same time as many functions as possible are tested out. Since in digital circuits many functions are executed over several clock cycles, such errors cannot be detected in one clock cycle. The test effort required for this is not feasible.

For test pattern generation, there are corresponding program tools which are continuously improved and which simplify test pattern generation. Bit patterns are used in functional tests, among other things, and reproduce a large part of the logical functions.

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Englisch: automated test pattern generation (test system) - ATPG
Updated at: 26.10.2007
#Words: 208
Links: test, digital, analog, indium (In), order
Translations: DE
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